Dataset: Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction




Files
421
3.1 GB
Samples
1
in dataset
Workflows
0
documented
Views
563
total views
Downloads
42
total downloads
Published
Feb 13, 2024
2 years ago

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421 files across 7 type(s)

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Published
Published: 2 years ago
Views
563
Downloads
42
Total Size
3.1 GB
Description

Contains data files for "Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction"

Binary 39 Excel 9 Image 103 MS-Word 5 Text 189 Unknown 75 Video 1
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Funding
This work was supported by the U.S. Department of Energy Office of Basic Energy Sciences Division of Materials Science and Engineering under Award #DE-SC0008637 as part of the Center for PRedictive Integrated Structural Materials Science (PRISMS). We acknowledge the European Synchrotron Radiation Facility (ESRF) for provision of beam time on ID06-HXM.