Dataset: Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction

To download the data for this dataset please Login or Register.

Published: 1 year ago Views: 286 Downloads: 40 DOI: 10.13011/m3-xbjb-va37 License: Attribution License (ODC-By) Size: 3.1 GB
  • No citations data found for this dataset or it's associated papers
  • Sangwon Lee
  • Tracy Berman
  • Ashley Bucsek
  • John Allison

Contains data files for "Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction"

This work was supported by the U.S. Department of Energy Office of Basic Energy Sciences Division of Materials Science and Engineering under Award #DE-SC0008637 as part of the Center for PRedictive Integrated Structural Materials Science (PRISMS). We acknowledge the European Synchrotron Radiation Facility (ESRF) for provision of beam time on ID06-HXM.

  • Binary (39)
  • Excel (9)
  • Image (103)
  • MS-Word (5)
  • Text (189)
  • Unknown (75)
  • Video (1)