Dataset: Oxygen Tracer Diffusion in Amorphous Hafnia Films for Resistive Memory


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Files
21
3.28 MB
Samples
0
in dataset
Workflows
0
documented
Views
374
total views
Downloads
39
total downloads
Published
Mar 22, 2024
2 years ago
File Types

21 files across 3 type(s)

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Published
Published: 2 years ago
Views
374
Downloads
39
DOI
10.13011/m3-e9jr-6g69
License
No license specified
Total Size
3.28 MB
Authors
MC Dongjae Shin Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA Anton V. Ievlev Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN, USA MC Jingxian Li Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA Karsten Beckmann College of Nanotechnology, Science and Engineering, University at Albany, Albany, NY, USA Nathaniel Cady College of Nanotechnology, Science and Engineering, University at Albany, Albany, NY, USA Pengyu Ren Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA MC Yiyang li Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA
Description

Raw data from electrical measurements, Tof-SIMS raw data, and materials characterization (XRD, XRR, STEM, XPS).

Excel 15 Image 5 Zipfile 1
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