Sample: Ti/SiO2 Ungroup Processes
Colloidal Silica Deposition and Oxidation Isothermal Exposure - 2h (1)
- Cooling Rate:
- No value
- Cooling Type:
- { "name": "Gas Cooled", "value": "gas_cooled" }
- Time:
- 2 h
- Temperature:
- 800 C
Sectioning (1)
- Notes:
- Sectioned output samples using slow speed diamond saw
STEM EDS (1)
- Stage:
- { "name": "Standard", "value": "standard" }
- Conventional Scanning:
- { "name": "Yes", "value": "yes" }
- Mode:
- { "name": "Scanning z-contrast", "value": "scanning_z_contrast" }
- Scanning:
- No value
- Spot Size:
- No value
- Camera Length:
- No value
- Apparatus:
- Hitachi HD-2300
- Voltage:
- 200 kV
Files
- STEM EDS - Pure Ti, Colloidal Silica, 2 hour oxidation, 800C, 20% O2 - O EDS Map.tif
- STEM EDS - Pure Ti, Colloidal Silica, 2 hour oxidation, 800C, 20% O2 - Pt EDS Map.tif
- STEM EDS - Pure Ti, Colloidal Silica, 2 hour oxidation, 800C, 20% O2 - Si EDS Map.tif
- STEM EDS - Pure Ti, Colloidal Silica, 2 hour oxidation, 800C, 20% O2 - Ti EDS Map.tif
- STEM Z Contrast- Pure Ti, Colloidal silica, 2 hr, 800C, 20% O2 - 25kx Location 3.TIF
TEM (1)
- Mode:
- { "name": "Diffraction Imaging", "value": "diffraction_imaging" }
- Spot Size:
- No value
- Scanning:
- { "name": "Bright Field", "value": "bright_field" }
- Apparatus:
- JEOL 2010F AEM
- Stage:
- { "name": "Standard", "value": "standard" }
- Camera Length:
- No value
- Conventional Scanning:
- { "name": "Yes", "value": "yes" }
- Voltage:
- 200 kV